"Mixed Pattern Recognition Methodology on Wafer Maps with Pre-trained ..."

Yunseon Byun, Jun-Geol Baek (2020)

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DOI: 10.5220/0009177909740979

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-14

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  - conf/icaart/ByunB20
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Yunseon Byun, Jun-Geol Baek:
Mixed Pattern Recognition Methodology on Wafer Maps with Pre-trained Convolutional Neural Networks. ICAART (2) 2020: 974-979

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