"Effect of thermal and electrical stress on photometric, radiometric, and ..."

Alaa Alchaddoud et al. (2018)

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DOI: 10.1109/IAS.2018.8544590

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-06

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Alaa Alchaddoud, Laurent Canale, Jamal Rammal, Georges Zissis:
Effect of thermal and electrical stress on photometric, radiometric, and colorimetric characteristics of large area white organic light emitting diodes. IAS 2018: 1-5

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