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"Eliminating Re-Burn-In in semiconductor manufacturing through statistical ..."

Hung V. Pham, Serge N. Demidenko, Giovanni M. Merola (2017)

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DOI: 10.1109/I2MTC.2017.7969957

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Hung V. Pham, Serge N. Demidenko, Giovanni M. Merola:
Eliminating Re-Burn-In in semiconductor manufacturing through statistical analysis of production test data. I2MTC 2017: 1-6

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