"Measurement of Excess Noise in Thin Film and Metal Foil Resistor Networks."

Nikolai Beev (2022)

> Home

Details and statistics

DOI: 10.1109/I2MTC48687.2022.9806690

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/i2mtc/Beev22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/i2mtc/Beev22
Nikolai Beev:
Measurement of Excess Noise in Thin Film and Metal Foil Resistor Networks. I2MTC 2022: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.