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"Contact PUF: Highly Stable Physical Unclonable Functions Based on Contact ..."
Duhyun Jeon et al. (2022)
- Duhyun Jeon, Dongmin Lee, Dong Kyue Kim, Byong-Deok Choi:
Contact PUF: Highly Stable Physical Unclonable Functions Based on Contact Failure Probability in 180 nm, 130 nm, and 28 nm CMOS Processes. HOST 2022: 85-88
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