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"Simulation-based functional test generation for embedded processors."

Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng (2005)

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DOI: 10.1109/HLDVT.2005.1568806

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  persistent URL:
  - https://dblp.org/rec/conf/hldvt/WenWC05
Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng:
Simulation-based functional test generation for embedded processors. HLDVT 2005: 3-10

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