"Test pattern generation for timing-induced functional errors in ..."

Srikanth Arekapudi et al. (2001)

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DOI: 10.1109/HLDVT.2001.972812

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Srikanth Arekapudi, Fei Xin, Jinzheng Peng, Ian G. Harris:
Test pattern generation for timing-induced functional errors in hardware-software systems. HLDVT 2001: 83-88

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