"A Framework for Explainable Root Cause Analysis in Manufacturing Systems - ..."

Daniel Kiefer et al. (2025)

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DOI: 10.24251/HICSS.2025.140

access: open

type: Conference or Workshop Paper

metadata version: 2025-10-02

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  - conf/hicss/KieferSBD25
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  - https://dblp.org/rec/conf/hicss/KieferSBD25
Daniel Kiefer, Tim Straub, Günter Bitsch, Clemens van Dinther:
A Framework for Explainable Root Cause Analysis in Manufacturing Systems - Combining Machine Learning, Explainable Artificial Intelligence and the Ishikawa Model for Industrial Manufacturing. HICSS 2025: 1-10

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