"7nm FinFET standard cell layout characterization and power density ..."

Tiansong Cui et al. (2014)

> Home

Details and statistics

DOI: 10.1109/IGCC.2014.7039170

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/green/CuiXWNP14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/green/CuiXWNP14
Tiansong Cui, Qing Xie, Yanzhi Wang, Shahin Nazarian, Massoud Pedram:
7nm FinFET standard cell layout characterization and power density prediction in near- and super-threshold voltage regimes. IGCC 2014: 1-7

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.