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"Test application time reduction for scan based sequential circuits."

Hao Zheng, Kewal K. Saluja, Rajiv Jain (1995)

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DOI: 10.1109/GLSV.1995.516050

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - conf/glvlsi/ZhengSJ95
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  persistent URL:
  - https://dblp.org/rec/conf/glvlsi/ZhengSJ95
Hao Zheng, Kewal K. Saluja, Rajiv Jain:
Test application time reduction for scan based sequential circuits. Great Lakes Symposium on VLSI 1995: 188-191

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