"RRAM Refresh Circuit: A Proposed Solution To Resolve The Soft-Error ..."

Amr M. S. Tosson, Mohab H. Anis, Lan Wei (2016)

> Home

Details and statistics

DOI: 10.1145/2902961.2903017

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/glvlsi/TossonAW16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/glvlsi/TossonAW16
Amr M. S. Tosson, Mohab H. Anis, Lan Wei:
RRAM Refresh Circuit: A Proposed Solution To Resolve The Soft-Error Failures For HfO₂/Hf 1T1R RRAM Memory Cell. ACM Great Lakes Symposium on VLSI 2016: 227-232

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.