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"Fault simulation and random test generation for speed-independent circuits."

Feng Shi, Yiorgos Makris (2004)

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DOI: 10.1145/988952.988984

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-03

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Feng Shi, Yiorgos Makris:
Fault simulation and random test generation for speed-independent circuits. ACM Great Lakes Symposium on VLSI 2004: 127-130

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