"DETECTive: Machine Learning-driven Automatic Test Pattern Prediction for ..."

Vincenzo Petrolo et al. (2024)

> Home

Details and statistics

DOI: 10.1145/3649476.3658696

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-18

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/glvlsi/PetroloMGP24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/glvlsi/PetroloMGP24
Vincenzo Petrolo, Sourav Medya, Mariagrazia Graziano, Debjit Pal:
DETECTive: Machine Learning-driven Automatic Test Pattern Prediction for Faults in Digital Circuits. ACM Great Lakes Symposium on VLSI 2024: 32-37

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.