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"Test and Design-for-Testability Solutions for Monolithic 3D Integrated ..."

Abhishek Koneru, Krishnendu Chakrabarty (2019)

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DOI: 10.1145/3299874.3319488

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Abhishek Koneru, Krishnendu Chakrabarty:
Test and Design-for-Testability Solutions for Monolithic 3D Integrated Circuits. ACM Great Lakes Symposium on VLSI 2019: 457-462

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