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"RT level reliability enhancement by constructing dynamic TMRS."

Naghmeh Karimi et al. (2007)

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DOI: 10.1145/1228784.1228829

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/glvlsi/KarimiMNL07
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  - https://dblp.org/rec/conf/glvlsi/KarimiMNL07
Naghmeh Karimi, Shahrzad Mirkhani, Zainalabedin Navabi, Fabrizio Lombardi:
RT level reliability enhancement by constructing dynamic TMRS. ACM Great Lakes Symposium on VLSI 2007: 172-175

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