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"On-die sensors for measuring process and environmental variations in ..."

Kanak Agarwal (2010)

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DOI: 10.1145/1785481.1785517

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-04

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Kanak Agarwal:
On-die sensors for measuring process and environmental variations in integrated circuits. ACM Great Lakes Symposium on VLSI 2010: 147-150

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