Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Micromachined probes for on-wafer measurement of millimeter- and ..."

Robert M. Weikle et al. (2013)

> Home

Details and statistics

DOI: 10.1109/GLOBALSIP.2013.6736989

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/globalsip/WeikleBLB13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/globalsip/WeikleBLB13
Robert M. Weikle, N. Scott Barker, Arthur W. Lichtenberger, Matthew F. Bauwens:
Micromachined probes for on-wafer measurement of millimeter- and submillimeter-wave devices and components. GlobalSIP 2013: 707-710

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.