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"Deep BIAS: Detecting Structural Bias using Explainable AI."

Bas van Stein et al. (2023)

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DOI: 10.1145/3583133.3590551

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-05

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  dblp key:
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Bas van Stein, Diederick Vermetten, Fabio Caraffini, Anna V. Kononova:
Deep BIAS: Detecting Structural Bias using Explainable AI. GECCO Companion 2023: 455-458

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