"Multiple Fault Diagnosis in Sequential Circuits Using Sensitizing Sequence ..."

Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu (1996)

Details and statistics

DOI: 10.1109/FTCS.1996.534597

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics