"Self-Checking and Fail-Safe LSIs by Intra-Chip Redundancy."

Nobuyasu Kanekawa et al. (1996)

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DOI: 10.1109/FTCS.1996.534628

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Nobuyasu Kanekawa, Makoto Nohmi, Yoshimichi Satoh, Hiroshi Satoh:
Self-Checking and Fail-Safe LSIs by Intra-Chip Redundancy. FTCS 1996: 426-430

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