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"A new validity index with K-means algorithm and its applications in ..."

Shihong Yue, Chenglong Yu, Ti Huang (2013)

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DOI: 10.1109/FSKD.2013.6816239

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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  - conf/fskd/YueYH13
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Shihong Yue, Chenglong Yu, Ti Huang:
A new validity index with K-means algorithm and its applications in electrical tomography. FSKD 2013: 450-455

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