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"Investigation on Gate Capacitances Fluctuation Due to Work-Function ..."
Wei-feng Lü, Mi Lin, Haipeng Zhang (2017)
- Wei-feng Lü, Mi Lin, Haipeng Zhang:
Investigation on Gate Capacitances Fluctuation Due to Work-Function Variation in Metal-Gate FinFETs. FSDM 2017: 398-403
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