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"Yield Rate Prediction of a Dynamic Random Access Memory Manufacturing ..."

Chun-Wei Chang, Shin-Yeu Lin (2016)

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DOI: 10.3233/978-1-61499-722-1-173

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Chun-Wei Chang, Shin-Yeu Lin:
Yield Rate Prediction of a Dynamic Random Access Memory Manufacturing Process Using Artificial Neural Network. FSDM 2016: 173-178

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