"Measure twice and cut once: Robust dynamic voltage scaling for FPGAs."

Ibrahim Ahmed et al. (2016)

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DOI: 10.1109/FPL.2016.7577342

access: closed

type: Conference or Workshop Paper

metadata version: 2019-02-18

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Ibrahim Ahmed, Shuze Zhao, Olivier Trescases, Vaughn Betz:
Measure twice and cut once: Robust dynamic voltage scaling for FPGAs. FPL 2016: 1-11

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