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"A Test Coverage-Based Model for Predicting Software Fault Content and ..."

Carol S. Smidts, Ying Shi (2009)

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DOI: 10.1007/978-3-642-10619-4_39

access: closed

type: Conference or Workshop Paper

metadata version: 2019-02-05

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  - conf/fgit/SmidtsS09
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Carol S. Smidts, Ying Shi:
A Test Coverage-Based Model for Predicting Software Fault Content and Location during Multi-phase Functional Testing. FGIT-ASEA 2009: 321-329

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