"Evolutionary approach to test generation of sequential digital circuits ..."

Yuriy A. Skobtsov, V. Y. Skobtsov (2010)

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DOI: 10.1109/EWDTS.2010.5742104

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Yuriy A. Skobtsov, V. Y. Skobtsov:
Evolutionary approach to test generation of sequential digital circuits with multiple observation time strategy. EWDTS 2010: 286-291

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