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"Optimizing test time for core-based 3-d integrated circuits by a technique ..."
Manjari Pradhan et al. (2014)
- Manjari Pradhan
, Debesh K. Das, Chandan Giri
, Hafizur Rahaman
:
Optimizing test time for core-based 3-d integrated circuits by a technique of bi-partitioning. EWDTS 2014: 1-4
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