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"Multiple stuck-at fault testability of a combinational circuit derived by ..."

Anzhela Yu. Matrosova, Eugeniy Mitrofanov, Toral Shah (2015)

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DOI: 10.1109/EWDTS.2015.7493099

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/ewdts/MatrosovaMS15
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  - https://dblp.org/rec/conf/ewdts/MatrosovaMS15
Anzhela Yu. Matrosova, Eugeniy Mitrofanov, Toral Shah:
Multiple stuck-at fault testability of a combinational circuit derived by covering ROBDD nodes by Invert-And-Or sub-circuits. EWDTS 2015: 1-4

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