"The Noise Immunity of CMOS Elements During their Switching and Exposure to ..."

Yuri V. Katunin, Vladimir Ya. Stenin (2020)

> Home

Details and statistics

DOI: 10.1109/EWDTS50664.2020.9225101

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ewdts/KatuninS20a
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ewdts/KatuninS20a
Yuri V. Katunin, Vladimir Ya. Stenin:
The Noise Immunity of CMOS Elements During their Switching and Exposure to an Ionizing Particle. EWDTS 2020: 1-4

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.