"A technique of optimal built-in self-test circuitries generation."

Natalia V. Chebykina, Sergey G. Mosin (2010)

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DOI: 10.1109/EWDTS.2010.5742133

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Natalia V. Chebykina, Sergey G. Mosin:
A technique of optimal built-in self-test circuitries generation. EWDTS 2010: 145-148

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