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ORCID"Random current testing for CMOS logic circuits by monitoring a dynamic ..."
Hideo Tamamoto, Hiroshi Yokoyama, Yuichi Narita (1992)
- Hideo Tamamoto, Hiroshi Yokoyama, Yuichi Narita:
Random current testing for CMOS logic circuits by monitoring a dynamic power supply current. EURO-DAC 1992: 480-485
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