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"An adaptive distributed algorithm for sequential circuit test generation."

James Sienicki et al. (1995)

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DOI: 10.1109/EURDAC.1995.527412

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/eurodac/SienickiBAA95
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  persistent URL:
  - https://dblp.org/rec/conf/eurodac/SienickiBAA95
James Sienicki, Michael L. Bushnell, Prathima Agrawal, Vishwani D. Agrawal:
An adaptive distributed algorithm for sequential circuit test generation. EURO-DAC 1995: 236-241

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