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"Testable path delay fault cover for sequential circuits."

Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakradhar (1996)

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DOI: 10.1109/EURDAC.1996.558208

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/eurodac/KrsticCC96
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  persistent URL:
  - https://dblp.org/rec/conf/eurodac/KrsticCC96
Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakradhar:
Testable path delay fault cover for sequential circuits. EURO-DAC 1996: 220-226

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