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"A new approach for the nonlinearity test of ADCs/DACs and its application ..."

Fang Xu (1999)

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DOI: 10.1109/ETW.1999.804206

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Fang Xu:
A new approach for the nonlinearity test of ADCs/DACs and its application for BIST. ETW 1999: 34-38

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