"A fast sweep-line-based failure pattern extractor for memory diagnosis."

Sin-Yu Wei, Bing-Yang Lin, Cheng-Wen Wu (2016)

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DOI: 10.1109/ETS.2016.7519314

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Sin-Yu Wei, Bing-Yang Lin, Cheng-Wen Wu:
A fast sweep-line-based failure pattern extractor for memory diagnosis. ETS 2016: 1-6

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