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"Improving test pattern generation in presence of unknown values beyond ..."

Karsten Scheibler, Dominik Erb, Bernd Becker (2015)

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DOI: 10.1109/ETS.2015.7138738

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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  - conf/ets/ScheiblerEB15
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Karsten Scheibler, Dominik Erb, Bernd Becker:
Improving test pattern generation in presence of unknown values beyond restricted symbolic logic. ETS 2015: 1-6

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