"High-Level Combined Deterministic and Pseudo-exhuastive Test Generation ..."

Adeboye Stephen Oyeniran et al. (2019)

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DOI: 10.1109/ETS.2019.8791526

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik:
High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors. ETS 2019: 1-6

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