"Optimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior ..."

Vinayak Bharat Naik et al. (2025)

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DOI: 10.1109/ETS63895.2025.11049625

access: closed

type: Conference or Workshop Paper

metadata version: 2025-07-07

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Vinayak Bharat Naik, Gregory Billus, Amit Kumar Shukla, Andre Vogel, Veit Kriegerstein, Patrick Scharf, Venkata Siva Komma, Johannes Mueller, Thomas Merbeth, Ralf Flemming, Ingolf Lorenz, Muthu Kumaran Nambi, Ee Ee Yeoh, Hemavathi Chaya, Siddharth Gupta, Yentsai Huang, Sushma Sambatur, Joerg Winkler, Tom Andre, Shane Hollmer, Steven Soss, Jongsin Yun, Wei Zou, Harshitha Kodali, Luc Romain, Albert Au, Lori Schramm, Martin Keim:
Optimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance. ETS 2025: 1-4

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