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"Internal feedback bridging faults in combinational CMOS circuits: analysis ..."

Yukiya Miura, Shuichi Seno (2001)

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DOI: 10.1109/ETW.2001.946655

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Yukiya Miura, Shuichi Seno:
Internal feedback bridging faults in combinational CMOS circuits: analysis and testing. ETW 2001: 9-16

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