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"Design and Test Challenges in Resistive Switching RAM (ReRAM): An ..."

Olivier Ginez, Jean-Michel Portal, Christophe Muller (2009)

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DOI: 10.1109/ETS.2009.23

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/ets/GinezPM09
Olivier Ginez, Jean-Michel Portal, Christophe Muller:
Design and Test Challenges in Resistive Switching RAM (ReRAM): An Electrical Model for Defect Injections. ETS 2009: 61-66

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