"Reusing scan chains for test pattern decompression."

Rainer Dorsch, Hans-Joachim Wunderlich (2001)

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DOI: 10.1109/ETW.2001.946677

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Rainer Dorsch, Hans-Joachim Wunderlich:
Reusing scan chains for test pattern decompression. ETW 2001: 124-132

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