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"From system level to defect-oriented test: a case study."

Octávio Páscoa Dias et al. (1999)

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DOI: 10.1109/ETW.1999.804509

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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  - conf/ets/DiasSSTT99
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Octávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel Maria Cacho Teixeira, João Paulo Teixeira:
From system level to defect-oriented test: a case study. ETW 1999: 136-141

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