"Test-station for flexible semi-automatic wafer-level silicon photonics ..."

Jeroen De Coster et al. (2016)

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DOI: 10.1109/ETS.2016.7519306

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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Jeroen De Coster, Peter De Heyn, Marianna Pantouvaki, Brad Snyder, Hongtao Chen, Erik Jan Marinissen, Philippe Absil, Joris Van Campenhout, Bryan Bolt:
Test-station for flexible semi-automatic wafer-level silicon photonics testing. ETS 2016: 1-6

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