"Power efficient scan testing by exploiting existing error tolerance ..."

Anthi Anastasiou, Yiorgos Tsiatouhas (2014)

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DOI: 10.1109/ETS.2014.6847834

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Anthi Anastasiou, Yiorgos Tsiatouhas:
Power efficient scan testing by exploiting existing error tolerance circuitry in a design. ETS 2014: 1-2

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