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"Joint impact of random variations and RTN on dynamic writeability in 28nm ..."

Brian Zimmer et al. (2014)

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DOI: 10.1109/ESSDERC.2014.6948767

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-27

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Brian Zimmer, Olivier Thomas, Seng Oon Toh, Taylor Vincent, Krste Asanovic, Borivoje Nikolic:
Joint impact of random variations and RTN on dynamic writeability in 28nm bulk and FDSOI SRAM. ESSDERC 2014: 98-101

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