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"Trap-assisted carrier transport through the multi-stack gate dielectrics ..."

Apoorva Ojha, Nihar R. Mohapatra (2017)

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DOI: 10.1109/ESSDERC.2017.8066626

access: closed

type: Conference or Workshop Paper

metadata version: 2017-10-19

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Apoorva Ojha, Nihar R. Mohapatra:
Trap-assisted carrier transport through the multi-stack gate dielectrics of HKMG nMOS transistors: A compact model. ESSDERC 2017: 200-203

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