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"Experimental characterization of the static noise margins of strained ..."
Gia Vinh Luong et al. (2017)
- Gia Vinh Luong, Sebastiano Strangio
, Andreas T. Tiedemann, Patric Bernardy, Stefan Trellenkamp, Pierpaolo Palestri, Siegfried Mantl, Qing-Tai Zhao
:
Experimental characterization of the static noise margins of strained silicon complementary tunnel-FET SRAM. ESSDERC 2017: 42-45
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