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"Characterization of border traps in III-V MOSFETs using an RF ..."

Sofia Johansson, Jiongjiong Mo, Erik Lind (2013)

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DOI: 10.1109/ESSDERC.2013.6818817

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-02

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  - conf/essderc/JohanssonML13
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Sofia Johansson, Jiongjiong Mo, Erik Lind:
Characterization of border traps in III-V MOSFETs using an RF transconductance method. ESSDERC 2013: 53-56

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