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"An array-based Chip Lifetime Predictor macro for gate dielectric failures ..."

Pulkit Jain, John Keane, Chris H. Kim (2012)

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DOI: 10.1109/ESSDERC.2012.6343383

access: closed

type: Conference or Workshop Paper

metadata version: 2018-01-02

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Pulkit Jain, John Keane, Chris H. Kim:
An array-based Chip Lifetime Predictor macro for gate dielectric failures in core and IO FETs. ESSDERC 2012: 262-265

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