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"Identifying failure mechanisms in LDMOS transistors by analytical ..."

Alessandro Ferrara et al. (2014)

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DOI: 10.1109/ESSDERC.2014.6948825

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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Alessandro Ferrara, Peter G. Steeneken, Boni K. Boksteen, Anco Heringa, Andries J. Scholten, Jurriaan Schmitz, Raymond J. E. Hueting:
Identifying failure mechanisms in LDMOS transistors by analytical stability analysis. ESSDERC 2014: 321-324

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